Institut de Chimie Moléculaire et des Matériaux d'Orsay

Mohamed-Khireddine Loudjani

Enseignant-Chercheur
Bât. 410, bureau 350 – SP2M – ICMMO
Université Paris-Sud
15, rue Georges Clémenceau
91405 Orsay Cedex
FRANCE

+33 1 69 15 47 94
mohamed-khireddine.loudjani@u-psud.fr

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Studies by X-ray Absorption Spectrometry (XAS) of the Local Order at the Zironium Threshold in an alpha-AL2O3 Layer Developed by Oxidation at High Temperature on an Alloy FeCr22Al5. M.-K. Loudjani, International Journal of Thin Films Science and Technology, 2019, 8, PP-1-4

Models, Methods and Measurements of Thin Films Resistivities of Ni/Cu Bi layers and Ni/Pd/Cu Tri layers Films. M.-K. Loudjani, C. Sella, International Journal of Thin Films Science and Technology, 2018, 7, 67-71

Models of Electric Transport in Bilayer Ni/Cu And in a Tri-layer Ni/Pd/Cu Thin Films. M.-K. Loudjani, C. Sella, International Journal of Thin Films Science and Technology, 2017, 6-N°3, PP-113-116

Choice of a Substrate for PdxNi1-x Thin Films used as Hydrogen Sensors. M.-K. Loudjani, International Journal of Thin Films Science and Technology, 2016, 5, 169-171

Resistivity of NixCu1-x Alloy Films. M.-K. Loudjani, C. Sella, International Journal of Thin Films Science and Technology, 2016, 5, 25-31

Study of texture, mechanical and electrical properties of cold drawn AGS alloy wire. M. Zidani, L. Bessais, H. Farh, M.-D. Hadid, S. Messaoudi, D. Miroud, M.-K. Loudjani, A.-L. Helbert, T. Baudin, Steel and Composite Structures, 2016, 22, 745-752

Relation between Microstructure and Electric Resistivity of Copper, Nickel, NixCu1-x Alloys and Ni/Cu Bilayered Thin Films. M.-K. Loudjani, C. Sella, International Journal of Thin Films Science and Technology, 2015, 4, 75-82