Institut de Chimie Moléculaire et des Matériaux d'Orsay



Diana Dragoé

LEHME - Build.: 410

Tel.: 01 69 15 31 96

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What you get:

X-ray Photoelectron Spectroscopy (XPS) gives qualitative and quantitative information on the surface chemical composition and the nature of chemical bonds. All elements can be detected with the exception of hydrogen and helium.
XPS is a non-destructive technique that requires ultra-high vacuum conditions.

Principle: The interaction of an X-ray photon having an energy hν with an atom or a molecule leads to their ionisation and the emission of a photoelectron having a kinetic energy Ec. The principle of X-ray Photoelectron Spectroscopy resides on the measurement of energy distribution of the emitted electrons. The emitting atoms can be identified using the binding energy of emitted electrons which can be deduced from El = hn - Ec - Fspec,
with El the energy of the level from which the electron is originating and Fspec the spectrometer work-function.

Material: The XPS available at ICMMO allows the analysis of all types of solid samples (maximum size 60 x 60 x 20 mm) and of powder samples.

How to use it: The XPS apparatus is generally not on self-service but can be operated after prior training given by the engineer in charge and only in case of very frequent use. External services are possible.

- Ion beam sputtering depth profile analysis
- Charge compensation allowing the measurement of insulating samples
- Angular resolution analysis using a tilt module (tilt range 0-70°)