Institut de Chimie Moléculaire et des Matériaux d'Orsay
 

2 Scanning Electron Microscopes with Field Emisison Guns, one wih a pressure controled chamber



   

Contact:

François BRISSET

Build.: 410/415

Tel.: 01 69 15 54 30

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What you get:

Electron imaging (SE, in-lens, BSE), EDS analyses (spectra and maps or lines), EBSD analysis (patterns and maps, charts or figures).

How it works:

An electron beam interacts with the sample. The elastic and inelastic interactions generate different types of signals, some of which will be detected and analyzed.

Materials:
Almost all types of materials (clean and non-hydrated) and prepared as they should. Other possible restrictions related to the size of the phases to analyze or the sample, working conditions to use, etc.



How to use it: They are not self-service microscopes. External services possible.

Options: SE, In-lens, BSE, VPSE, STEM, EBSD, EDS detectors, heating stage.