Institut de Chimie Moléculaire et des Matériaux d'Orsay

Scanning Electron Microscope with Field Emisison Gun and a pressure controled chamber



François BRISSET

Build.: 410/415

Tel.: 01 69 15 54 30

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What you get:

Electron imaging (SE, in-lens, BSE), EDS analyses (spectra and maps or lines), EBSD analysis (patterns and maps, charts or figures).

How it works:

An electron beam interacts with the sample. The elastic and inelastic interactions generate different types of signals, some of which will be detected and analyzed.

Almost all types of materials (clean and non-hydrated) and prepared as they should. Other possible restrictions related to the size of the phases to analyze or the sample, working conditions to use, etc.

How to use it: They are not self-service microscopes. External services possible.

Options: SE, In-lens, BSE, VPSE, STEM, EBSD, EDS detectors, heating stage.