Institut de Chimie Moléculaire et des Matériaux d'Orsay
 

Scanning Electron Microscope with Field Emisison Gun



 
 

Contact:

François BRISSET

Build. : 410/415

Tel.: 01 69 15 54 30

Send an email


What you get:

Electron imaging (SE and BSE), EDS analysis possible (spectra or maps and lines), EBSD.

How it works:

An electron beam interacts with the sample. The elastic and inelastic interactions generate different types of signals, some of which will be detected and analyzed.

Materials:

Almost all types of materials (clean and non-hydrated) and prepared as they should. Other possible restrictions related to the size of the phases to analyze or the sample, working conditions to use, etc.

How to use it: Possible self-service microscope under conditions (training and validation). External services possible.

Options: bending, heating and cooling stages.