Institut de Chimie Moléculaire et des Matériaux d'Orsay

Low angle Xrays Diffractometer



    Contact:

Michaële HERBST

Build.: 410

Tel. : 01 69 15 77 56

Send an email


What you get:

Characterization of bulk samples or thin films

- θ/2θ or low angle: phase analysis, crystal structure, reflectometry on film: roughness, density, thickness.

- Strain and textures


Principle:

When an X-rays monochromatic and parallel beam strikes a crystal, it is diffracted by some lattice plans as regard to the Bragg's law: nλ = 2d sinω and diffraction peaks are obtained (with n: order of diffraction, λ: wavelength of X-ray beam, d: distance between two lattice planes, ω: angle of incidence of X-rays).

 
Materials:

Diffraction analysis of polycrystalline or singlecrystal materials. For some characterizations, constraints on the surface quality are required.

How to use it: The X-ray diffractometer can be under free service under authorization.