Institut de Chimie Moléculaire et des Matériaux d'Orsay

Scanning Tunneling and Atomic force Microscopies



    Contact:

Jean-Claude POULIN

Build.: 420

Tel.: 01 69 15 76 51

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What you get:

Surface observation, digital topographic and electronic imaging, bonding information, friction or hardness of the surface (imaging or spectroscopy).

Principle:

A tip comes into contact or close to the surface to explore. in AFM: mechanical interaction tip-surface (permanent or intermittent contact), in STM: tip and sample are electrically conductive and provide images through the tunnel current flowing between them.

Materials:

Various materials can be studied by AFM, for STM sample must be conductive or deposited on a perfectly flat conductor. Operation at atmospheric pressure, can control the environment (liquid, gas, temperature). The observed surface must be flat, of reasonable size.

Who to use it: A large attention to details is necessary, initiation possible for regular use.

Options:

Low current STM (from pA to nA), variable temperature (-5 to 40°C and room temp. to 200°C), liquid cells, environmental chamber. Maximum area observed: 10μm aside in STM, 6μm aside in AFM using intermittent contact mode, 20μm aside in contact AFM.